[CCoE Notice] AFM Technology Workshop with Live Demonstrations of Dimension FastScan at UH Science Center

[Grayson, Audrey A]

AFM Technology Workshop with Live Demonstrations of Dimension FastScan Presented by TcSUH<http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/LabReports/Univ_Houston_workshop_Aug21-22_v4-72413-cs.pdf>
AFM Technology Workshop with Live Demonstrations of Dimension FastScan(tm)

August 21-22 | Houston Science Center, Room 102
University of Houston, Texas

Bruker Nano Surfaces in collaboration with TcSUH University of Houston is proud to announce a technology presentation of our Dimension Fastscan AFM.

During this 2-day workshop, we will present the latest technological advances in high-speed AFM, high-resolution nanoelectrical modes and self-sensing, unattended AFM.

AGENDA

AUGUST 21

9:00 Introduction to Bruker metrology and high-speed AFM Imaging
Speaker: Sharath Nair

9:30 Advances in nanoelectrical modes & nanomechanical property mapping with AFM.
Speaker: Senli Guo

Bruker's recent technology advances are making AFMs easier to use, providing more unambiguous and quantitative information and extending the ability of AFMs to work with the most challenging samples. Learn about ScanAsyst-self-optimizing AFM imaging; PeakForce QNM-quantitative nanomechanical mapping of material properties, including modulus and adhesion measurements on a wide range of samples; new nanoelectrical characterization modes including Peak Force Kelvin probe force microscopy (PFKPFM)

10:30 Practical workshop: PeakForce Kelvin Probe Microscopy (PFKPFM)
Session will demonstrate the new PFKPFM mode utilizing exclusive PeakForce Tapping(tm) technology, enabling quantitative work function mapping at top spatial resolution with higher sensitivity and immunity to artifacts from mechanical crosstalk.

11:15 Practical workshop: High-speed AFM imaging
Session will demonstrate extreme imaging speeds achieved with Fasts can AFM on large and small size samples in air or fluids, without loss of resolution.

12:00 Lunch (for registered attendees)

1-5:00 Hands on sample analysis with Dimension FastScan (Registered samples only)
Bruker applications scientist will be available to provide guidance and training on your sample measurements

AUGUST 22

9-4:00 Hands-on sample analysis with Dimension FastScan (Registered samples only)
Bruker applications scientists will be available to provide guidance and training on your sample measurements

COMPLIMENTARY WORKSHOP

Seats are limited. Register online at: www.bruker.com/BNS-NA_workshops<http://www.bruker.com/BNS-NA_workshops>

Reserve hands-on time with the instruments: Sharath.nair at bruker-nano.com<mailto:Sharath.nair%40bruker-nano.com>
System demonstration and sample measurement is on a first come, first serve basis

Download the brochure: http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/LabReports/Univ_Houston_workshop_Aug21-22_v4-72413-cs.pdf.



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