[CCoE Notice] Seminar announcement

Tekin, Eylem etekin at Central.UH.EDU
Tue Feb 26 13:42:39 CST 2013


INDUSTRIAL ENGINEERING SEMINAR

Date: March 1, 2013
Time: 10am-11am
Place: D 102


n-Subpopulations Experiencing Stochastic Degradation:

Reliability Modeling, Burn-in and Maintenance Optimization

Yisha Xiang
Assistant Professor, Department of Management Sciences
Sun Yat-sen University, China

Abstract

For some engineering design and manufacturing applications, particularly for evolving and new technologies, populations of manufactured components can be heterogeneous and consist of several sub-populations. The co-existence of n subpopulations is particularly common in devices when the manufacturing process is still maturing or highly variable. New models are developed and demonstrated to simultaneously determine burn-in and maintenance policies for populations composed of distinct subpopulations subject to stochastic degradation. Unlike traditional burn-in procedures that stress devices to failure, we present a decision rule that uses burn-in threshold on cumulative deterioration, in addition to burn-in time, to eliminate weak subpopulations. Only devices with post-burn-in deterioration levels below the burn-in threshold are released for field operations. We examine the effectiveness of such integrated policies for the heterogeneous populations of our interests. Numerical examples are provided to illustrate the proposed procedure.


Biography


Yisha Xiang is an Assistant Professor in the Department of Management Sciences at Sun Yat-sen University, China.  She received her B.S. in Industrial Engineering from Nanjing University of Aero. & Astro., China, and M.S and Ph.D. in Industrial Engineering from University of Arkansas.  Her current research and teaching interests involves reliability modeling and optimization, risk analysis, and healthcare. She has published articles in refereed journals, such as IIE Transactions, European Journal of Operational Research, and Computers and Industrial Engineering. She is a member of IIE and INFORMS.

-------------- next part --------------
An HTML attachment was scrubbed...
URL: http://Bug.EGR.UH.EDU/pipermail/engi-dist/attachments/20130226/4fca10e8/attachment.html 


More information about the Engi-Dist mailing list