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</o:shapelayout></xml><![endif]--></head><body lang=EN-US link=blue vlink=purple><div class=WordSection1><p class=MsoNormal style='mso-margin-top-alt:auto;mso-margin-bottom-alt:auto'><b><span style='font-size:18.0pt;font-family:"Times New Roman","serif"'><a href="http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/LabReports/Univ_Houston_workshop_Aug21-22_v4-72413-cs.pdf">AFM Technology Workshop with Live Demonstrations of Dimension FastScan Presented by TcSUH</a><o:p></o:p></span></b></p><h1>AFM Technology Workshop with Live Demonstrations of Dimension FastScan™<o:p></o:p></h1><p>August 21-22 | Houston Science Center, Room 102<br>University of Houston, Texas<o:p></o:p></p><p>Bruker Nano Surfaces in collaboration with TcSUH University of Houston is proud to announce a technology presentation of our Dimension Fastscan AFM.<o:p></o:p></p><p>During this 2-day workshop, we will present the latest technological advances in high-speed AFM, high-resolution nanoelectrical modes and self-sensing, unattended AFM.<o:p></o:p></p><p><strong>AGENDA</strong><o:p></o:p></p><p>AUGUST 21<o:p></o:p></p><p>9:00 <strong>Introduction to Bruker metrology and high-speed AFM Imaging</strong><br><em>Speaker: Sharath Nair</em><o:p></o:p></p><p>9:30 <strong>Advances in nanoelectrical modes & nanomechanical property mapping with AFM.</strong><br><em>Speaker: Senli Guo</em><o:p></o:p></p><p>Bruker’s recent technology advances are making AFMs easier to use, providing more unambiguous and quantitative information and extending the ability of AFMs to work with the most challenging samples. Learn about <strong>ScanAsyst</strong>–self-optimizing AFM imaging; <strong>PeakForce QNM</strong>-quantitative nanomechanical mapping of material properties, including modulus and adhesion measurements on a wide range of samples; new nanoelectrical characterization modes including <strong>Peak Force Kelvin probe force microscopy (PFKPFM)</strong><o:p></o:p></p><p>10:30 <strong>Practical workshop</strong>: PeakForce Kelvin Probe Microscopy (PFKPFM)<br>Session will demonstrate the new PFKPFM mode utilizing exclusive PeakForce Tapping™ technology, enabling quantitative work function mapping at top spatial resolution with higher sensitivity and immunity to artifacts from mechanical crosstalk.<o:p></o:p></p><p>11:15 <strong>Practical workshop</strong>: High-speed AFM imaging<br>Session will demonstrate extreme imaging speeds achieved with Fasts can AFM on large and small size samples in air or fluids, without loss of resolution.<o:p></o:p></p><p>12:00 <strong>Lunch (for registered attendees)</strong><o:p></o:p></p><p>1–5:00 <strong>Hands on sample analysis with Dimension FastScan</strong> (Registered samples only)<br><em>Bruker applications scientist will be available to provide guidance and training on your sample measurements</em><o:p></o:p></p><p>AUGUST 22<o:p></o:p></p><p>9–4:00 <strong>Hands-on sample analysis with Dimension FastScan</strong> (Registered samples only)<br><em>Bruker applications scientists will be available to provide guidance and training on your sample measurements</em><o:p></o:p></p><p>COMPLIMENTARY WORKSHOP<o:p></o:p></p><p><strong>Seats are limited. Register online at: </strong><a href="http://www.bruker.com/BNS-NA_workshops" target="_blank">www.bruker.com/BNS-NA_workshops</a><o:p></o:p></p><p><strong>Reserve hands-on time with the instruments: </strong><a href="mailto:Sharath.nair%40bruker-nano.com">Sharath.nair@bruker-nano.com</a><br>System demonstration and sample measurement is on a first come, first serve basis<o:p></o:p></p><p>Download the brochure: <a href="http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/LabReports/Univ_Houston_workshop_Aug21-22_v4-72413-cs.pdf" target="_blank">http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/LabReports/Univ_Houston_workshop_Aug21-22_v4-72413-cs.pdf</a>.<o:p></o:p></p><p class=MsoNormal><o:p> </o:p></p><p class=MsoNormal><o:p> </o:p></p><p class=MsoNormal><o:p> </o:p></p></div></body></html>