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</o:shapelayout></xml><![endif]--></head><body lang=EN-US link=blue vlink=purple><div class=WordSection1><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:16.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'>INDUSTRIAL ENGINEERING SEMINAR<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:16.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'><o:p> </o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:16.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'>Date: March 1, 2013<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:16.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'>Time: 10am-11am<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:16.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'>Place: D 102<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-family:"Times New Roman","serif";color:navy'><o:p> </o:p></span></b></p><p class=papertitleCxSpFirst style='margin-bottom:0in;margin-bottom:.0001pt;mso-add-space:auto;line-height:150%'><b><i><span style='font-size:14.0pt;line-height:150%'>n</span></i></b><b><span style='font-size:14.0pt;line-height:150%'>-Subpopulations Experiencing Stochastic Degradation: <o:p></o:p></span></b></p><p class=papertitleCxSpLast style='margin-bottom:0in;margin-bottom:.0001pt;mso-add-space:auto;line-height:150%'><b><span style='font-size:14.0pt;line-height:150%'>Reliability Modeling, Burn-in and Maintenance Optimization</span></b><span style='font-size:14.0pt;line-height:150%;mso-fareast-language:ZH-CN'><o:p></o:p></span></p><p class=MsoNormal align=center style='text-align:center'><b><span style='font-size:14.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></b></p><p class=MsoNormal align=center style='text-align:center'><b><span style='font-size:14.0pt;font-family:"Times New Roman","serif"'>Yisha Xiang<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center'><b><span style='font-size:14.0pt;font-family:"Times New Roman","serif"'>Assistant Professor, Department of Management Sciences<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center'><b><span style='font-size:14.0pt;font-family:"Times New Roman","serif"'>Sun Yat-sen University, China<o:p></o:p></span></b></p><p class=MsoNormal style='text-align:justify;line-height:110%'><b><span style='font-size:14.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'><o:p> </o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:14.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'>Abstract<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:14.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'><o:p> </o:p></span></b></p><p class=MsoNormal style='text-align:justify;line-height:110%'><span style='font-family:"Times New Roman","serif"'>For some engineering design and manufacturing applications, particularly for evolving and new technologies, populations of manufactured components can be heterogeneous and consist of several sub-populations. The co-existence of <i>n</i> subpopulations is particularly common in devices when the manufacturing process is still maturing or highly variable. New models are developed and demonstrated to simultaneously determine burn-in and maintenance policies for populations composed of distinct subpopulations subject to stochastic degradation. Unlike traditional burn-in procedures that stress devices to failure, we present a decision rule that uses burn-in threshold on cumulative deterioration, in addition to burn-in time, to eliminate weak subpopulations. Only devices with post-burn-in deterioration levels below the burn-in threshold are released for field operations. We examine the effectiveness of such integrated policies for the heterogeneous populations of our interests. Numerical examples are provided to illustrate the proposed procedure.</span><b><span style='font-size:14.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'><o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><span style='font-size:14.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'><o:p> </o:p></span></p><p class=MsoNormal style='text-align:justify'><span style='font-size:12.0pt;font-family:"Times New Roman","serif"'><o:p> </o:p></span></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><b><span style='font-size:14.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'>Biography<o:p></o:p></span></b></p><p class=MsoNormal align=center style='text-align:center;line-height:110%'><span style='font-size:14.0pt;line-height:110%;font-family:"Times New Roman","serif";color:red'><o:p> </o:p></span></p><p class=Biography><b>Yisha Xiang </b>is an Assistant Professor in the Department of Management Sciences at Sun Yat-sen University, China. She received her B.S. in Industrial Engineering from Nanjing University of Aero. & Astro., China, and M.S and Ph.D. in Industrial Engineering from University of Arkansas. Her current research and teaching interests involves reliability modeling and optimization, risk analysis, and healthcare. She has published articles in refereed journals, such as <i>IIE Transactions, European Journal of Operational Research, and Computers and Industrial Engineering</i>. She is a member of IIE and INFORMS.<span class=MsoHyperlink><o:p></o:p></span></p><p class=MsoNormal><span style='font-family:"Times New Roman","serif";color:#1F497D'><o:p> </o:p></span></p></div></body></html>